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ET
2002
97views more  ET 2002»
13 years 7 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
ECCV
2008
Springer
14 years 9 months ago
A Generative Shape Regularization Model for Robust Face Alignment
In this paper, we present a robust face alignment system that is capable of dealing with exaggerating expressions, large occlusions, and a wide variety of image noises. The robustn...
Leon Gu, Takeo Kanade
ITC
1998
IEEE
59views Hardware» more  ITC 1998»
14 years 2 days ago
Stimulus generation for built-in self-test of charge-pump phase-locked loops
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...
Benoît R. Veillette, Gordon W. Roberts
ICIP
2009
IEEE
14 years 8 months ago
Fluorescence Microscopy Imaging Denoising With Log-euclidean Priors And Photobleaching Compensation
Fluorescent protein microscopy imaging is nowadays one of the most important tools in biomedical research. However, the resulting images present a low signal to noise ratio and a ...
TODAES
2002
134views more  TODAES 2002»
13 years 7 months ago
False-noise analysis using logic implications
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
Alexey Glebov, Sergey Gavrilov, David Blaauw, Vlad...