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DAC
2007
ACM
14 years 9 months ago
Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver
Abstracting with credit is permitted. To copy otherwise, to republish, to post on servers, to redistribute to lists, or to use any component of this work in other works requires pr...
Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung...
ICCV
2011
IEEE
12 years 8 months ago
A robust pipeline for rapid feature-based pre-alignment of dense range scans
Aiming at reaching an interactive and simplified usage of high-resolution 3D acquisition systems, this paper presents a fast and automated technique for pre-alignment of dense ra...
Francesco Bonarrigo, Alberto Signoroni, Riccardo L...
IWMM
2011
Springer
206views Hardware» more  IWMM 2011»
12 years 11 months ago
A comprehensive evaluation of object scanning techniques
At the heart of all garbage collectors lies the process of identifying and processing reference fields within an object. Despite its key role, and evidence of many different impl...
Robin Garner, Stephen M. Blackburn, Daniel Frampto...
ICS
2009
Tsinghua U.
14 years 3 months ago
High-performance regular expression scanning on the Cell/B.E. processor
Matching regular expressions (regexps) is a very common workload. For example, tokenization, which consists of recognizing words or keywords in a character stream, appears in ever...
Daniele Paolo Scarpazza, Gregory F. Russell
MOBIWAC
2009
ACM
14 years 3 months ago
MeshScan: fast and efficient handoff in IEEE802.11 mesh networks
Handoff delay is one of the major problems in Wireless Mesh Network (WMN) that needs to be solved in order to allow time-critical and real-time applications run continuously durin...
Yin Chen, Karol Kowalik, Mark Davis