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ICASSP
2011
IEEE
13 years 1 months ago
Detection of elliptical particles in atomic force microscopy images
In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
Jirí Sedlár, Barbara Zitová, ...
ISBI
2008
IEEE
14 years 10 months ago
Blind deconvolution for diffraction-limited fluorescence microscopy
Optical Sections of biological samples obtained from a fluorescence Confocal Laser Scanning Microscopes (CLSM) are often degraded by out-of-focus blur and photon counting noise. S...
Praveen Pankajakshan, Bo Zhang, Laure Blanc-F&eacu...
ICASSP
2009
IEEE
14 years 4 months ago
Compressive confocal microscopy
In this paper, a new approach for Confocal Microscopy (CM) based on the framework of compressive sensing is developed. In the proposed approach, a point illumination and a random ...
Peng Ye, José L. Paredes, Gonzalo R. Arce, ...
ISBI
2009
IEEE
14 years 4 months ago
Cell Tracking and Segmentation in Electron Microscopy Images Using Graph Cuts
Understanding neural connectivity and structures in the brain requires detailed 3D anatomical models, and such an understanding is essential to the study of the nervous system. Ho...
Huei-Fang Yang, Yoonsuck Choe
CDC
2009
IEEE
142views Control Systems» more  CDC 2009»
14 years 2 months ago
Towards STEM control: Modeling framework and development of a sensor for defocus control
— Scanning transmission electron microscopes are indispensable tools for material science research, since they can reveal the internal structure of a wide range of specimens. Thu...
Arturo Tejada, Wouter Van den Broek, Saartje W. va...