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DATE
2008
IEEE
86views Hardware» more  DATE 2008»
14 years 2 months ago
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Ric...
WSC
2000
13 years 9 months ago
Look-ahead strategies for controlling batch operations in industry: overview, comparison and exploration
Batching jobs in a manufacturing system is a very common policy in most industries. The main reasons for batching are avoidance of set ups and/or facilitation of material handling...
Durk-Jouke van der Zee
WSC
1997
13 years 9 months ago
Using SiMPLE++ for Improved Modeling Efficiencies and Extending Model Life Cycles
SiMPLE++ is an object-oriented simulation environment for modeling all types of manufacturing, logistics and service systems. AESOP’s SiMPLE++ is a fully object-oriented impleme...
David R. Kalasky, Gerald A. Levasseur
EOR
2007
89views more  EOR 2007»
13 years 8 months ago
Managing a portfolio of long term service agreements
Long-term service agreements (LTSA) for the maintenance of capital-intensive equipment such as gas turbines and aircraft engines are gaining wide acceptance. A typical LTSA contra...
Srinivas Bollapragada, Aparna Gupta, Chaipat Lawsi...
IOR
2007
106views more  IOR 2007»
13 years 7 months ago
Planning and Scheduling by Logic-Based Benders Decomposition
We combine mixed integer linear programming (MILP) and constraint programming (CP) to solve an important class of planning and scheduling problems. Tasks are allocated to faciliti...
John N. Hooker