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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
15 years 10 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
ICCS
2005
Springer
15 years 9 months ago
Towards a Bayesian Approach to Robust Finding Correspondences in Multiple View Geometry Environments
Abstract. This paper presents a new Bayesian approach to the problem of finding correspondences of moving objects in a multiple calibrated camera environment. Moving objects are d...
Cristian Canton-Ferrer, Josep R. Casas, Montse Par...
CGI
2000
IEEE
15 years 8 months ago
Head Detection and Tracking by 2-D and 3-D Ellipsoid Fitting
A novel procedure for segmenting a set of scattered 3D data obtained from a head and shoulders multiview sequence is presented. The procedure consists of two steps. In the first ...
Nikos Grammalidis, Michael G. Strintzis
ICPR
2008
IEEE
15 years 10 months ago
A novel automatic seed point selection algorithm for breast ultrasound images
Region growing is a frequently used segmentation method for medical ultrasound images processing. The first step of region growing is selecting the seed point which is inside the ...
Juan Shan, Heng-Da Cheng, Yuxuan Wang
ICPR
2000
IEEE
15 years 8 months ago
Boundary Estimation from Intensity/Color Images with Algebraic Curve Models
A new concept and algorithm are presented for noniterative robust estimation of piecewise smooth curves of maximal edge strength in small image windows – typically  ¢¡£  to...
Tolga Tasdizen, David B. Cooper