376 search results - page 24 / 76 » Self-Assembled Circuit Patterns |
FDTC
2010
Springer
13 years 5 months ago
2010
Springer
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing
CORR
2010
Springer
13 years 5 months ago
2010
Springer
Describing the collective activity of neural populations is a daunting task: the number of possible patterns grows exponentially with the number of cells, resulting in practically...
VTS
2002
IEEE
14 years 14 days ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
IJON
2007
13 years 7 months ago
2007
— This paper, presents a feasability study of a central pattern generator-based analog controller for an autonomous robot. The operation of a neuronal circuit formed of electroni...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...