376 search results - page 43 / 76 » Self-Assembled Circuit Patterns |
ISPD
2004
ACM
14 years 1 months ago
2004
ACM
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
ITC
2003
IEEE
14 years 26 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
ATS
2009
IEEE
13 years 5 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents a technique to visualize the communication pattern of a parallel application at different points during its execution. Unlike many existing tools that show the...