1287 search results - page 155 / 258 » Self-Normalized Linear Tests |
VEE
2012
ACM
12 years 4 months ago
2012
ACM
As cloud-based computation becomes increasingly important, providing a general computational interface to support datacenterscale programming has become an imperative research age...
CVPR
2012
IEEE
11 years 11 months ago
2012
IEEE
Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one of two extreme options: mat...
LATA
2009
Springer
14 years 4 months ago
2009
Springer
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a rest...
IH
2009
Springer
14 years 3 months ago
2009
Springer
Media forensics tries to determine the originating device of a signal. We apply this paradigm to microphone forensics, determining the microphone model used to record a given audio...
VTS
2000
IEEE
14 years 1 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...