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ITC
1996
IEEE
127views Hardware» more  ITC 1996»
13 years 12 months ago
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
Nur A. Touba, Edward J. McCluskey
NIPS
1996
13 years 9 months ago
Combinations of Weak Classifiers
To obtain classification systems with both good generalizat`ion performance and efficiency in space and time, we propose a learning method based on combinations of weak classifiers...
Chuanyi Ji, Sheng Ma
ATS
2005
IEEE
164views Hardware» more  ATS 2005»
13 years 9 months ago
A Family of Logical Fault Models for Reversible Circuits
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
ACL
1998
13 years 9 months ago
Automated Scoring Using A Hybrid Feature Identification Technique
This study exploits statistical redundancy inherent in natural language to automatically predict scores for essays. We use a hybrid feature identification method, including syntac...
Jill Burstein, Karen Kukich, Susanne Wolff, Chi Lu...
CSDA
2008
79views more  CSDA 2008»
13 years 7 months ago
Varying-coefficient single-index model
Abstract. To study the relationship between the levels of chemical pollutants and the number of daily total hospital admissions for respiratory diseases and to find the effect of t...
Heung Wong, Wai-Cheung Ip, Riquan Zhang