1287 search results - page 60 / 258 » Self-Normalized Linear Tests |
ICCAD
1999
IEEE
14 years 3 days ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
DDECS
2006
IEEE
14 years 1 months ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
METRICS
2003
IEEE
14 years 1 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
KDD
1994
ACM
13 years 12 months ago
1994
ACM
We applied TETRAD II, a causal discovery program developed in Carnegie Mellon University's Department of Philosophy, to a database containing information on 204 U.S. colleges...
FATES
2004
Springer
14 years 1 months ago
2004
Springer
This paper presents a method for reducing the cost of test generation. A spanning set for a coverage criterion is a set of entities such that exercising every entity in the spannin...