1287 search results - page 83 / 258 » Self-Normalized Linear Tests |
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
ISBI
2011
IEEE
12 years 11 months ago
2011
IEEE
For medical image analysis, the test statistic of the measurements is usually constructed at every voxels in space and thresholded to determine the regions of significant signals...
ICRA
2008
IEEE
14 years 2 months ago
2008
IEEE
— Local linearizations are ubiquitous in the control of robotic systems. Analytical methods, if available, can be used to obtain the linearization, but in complex robotics system...
CGO
2010
IEEE
14 years 2 months ago
2010
IEEE
The linear scan algorithm for register allocation provides a good register assignment with a low compilation overhead and is thus frequently used for just-in-time compilers. Altho...
KDD
2009
ACM
14 years 2 months ago
2009
ACM
Anomalous windows are the contiguous groupings of data points. In this paper, we propose an approach for discovering anomalous windows using Scan Statistics for Linear Intersectin...