25 search results - page 4 / 5 » Sequential Circuits Applicable for Detecting Different Types... |
IAJIT
2010
13 years 6 months ago
2010
: A test procedure for testing mainly the boundary scan cells, and testing partially the test access port controller in programmable logic devices, and field programmable gate arra...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
FDTC
2006
Springer
13 years 11 months ago
2006
Springer
We present a new type of fault attacks on elliptic curve scalar multiplications: Sign Change Attacks. These attacks exploit different number representations as they are often emplo...
EUROGP
2009
Springer
14 years 2 days ago
2009
Springer
The contribution presented herein proposes an adaptive genetic algorithm applied to quantum logic circuit synthesis that, dynamically adjusts its control parameters. The adaptation...
EUC
2007
Springer
13 years 11 months ago
2007
Springer
A Wireless Sensor Network (WSN) composed of tiny sensor nodes may operate in an unfavorable terrain. The coupling of inherent limitations and harsh environments makes WSNs fallible...