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ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
14 years 3 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
SRDS
2008
IEEE
14 years 3 months ago
Self-Stabilization in Tree-Structured Peer-to-Peer Service Discovery Systems
The efficiency of service discovery is critical in the development of fully decentralized middleware intended to manage large scale computational grids. This demand influenced t...
Eddy Caron, Ajoy Kumar Datta, Franck Petit, C&eacu...
SRDS
2008
IEEE
14 years 3 months ago
Towards Reliable Reputations for Dynamic Networked Systems
A new generation of distributed systems and applications rely on the cooperation of diverse user populations motivated by self-interest. While they can utilize “reputation syste...
Gayatri Swamynathan, Ben Y. Zhao, Kevin C. Almerot...
COMSWARE
2007
IEEE
14 years 3 months ago
Integrated Data Location in Multihop Wireless Networks
Abstract— Multihop wireless networks are ideal as infrastructures for location-aware network applications, particularly for disaster recovery operations. However, one missing com...
Irfan Sheriff, Prashanth Aravinda Kumar Acharya, A...
DSN
2007
IEEE
14 years 3 months ago
R-Sentry: Providing Continuous Sensor Services against Random Node Failures
The success of sensor-driven applications is reliant on whether a steady stream of data can be provided by the underlying system. This need, however, poses great challenges to sen...
Shengchao Yu, Yanyong Zhang