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ET
2002
97views more  ET 2002»
15 years 5 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
MONET
1998
94views more  MONET 1998»
15 years 5 months ago
Hierarchically-Organized, Multihop Mobile Wireless Networks for Quality-of-Service Support
MMWN is a modular system of link- and network-layer algorithms that enables a multihop mobile wireless network to support distributed, real-time multimedia applications. In this pa...
Ram Ramanathan, Martha Steenstrup
TVLSI
2002
93views more  TVLSI 2002»
15 years 5 months ago
Simultaneous switching noise in on-chip CMOS power distribution networks
Simultaneous switching noise (SSN) has become an important issue in the design of the internal on-chip power distribution networks in current very large scale integration/ultra lar...
Kevin T. Tang, Eby G. Friedman
ICCAD
2008
IEEE
200views Hardware» more  ICCAD 2008»
14 years 11 months ago
Accurate Equivalent Energy Breakeven Time Estimation for Power Gating
Run-time Power Gating (RTPG) is a recent technique, which aims at aggressively reducing leakage power consumption. Energy breakeven time (EBT), or equivalent sleep time has been pr...
Hao Xu, Wen-Ben Jone, Ranga Vemuri
ASPDAC
2011
ACM
167views Hardware» more  ASPDAC 2011»
14 years 9 months ago
Variation-tolerant and self-repair design methodology for low temperature polycrystalline silicon liquid crystal and organic lig
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
Chih-Hsiang Ho, Chao Lu, Debabrata Mohapatra, Kaus...