295 search results - page 8 / 59 » Simultaneous Quantifier Elimination |
MICCAI
2003
Springer
14 years 9 months ago
2003
Springer
Quantitative measurements of changes in evolving brain pathology, such as multiple sclerosis lesions and brain tumors, are important for clinicians to perform pertinent diagnoses a...
ISCAS
2006
IEEE
14 years 2 months ago
2006
IEEE
— In this paper we propose a new metric called “effective tunneling capacitance” (Ct eff ) to quantify the transient swing in the gate leakage (gate oxide tunneling) current ...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...
OOPSLA
2005
Springer
14 years 2 months ago
2005
Springer
Garbage collection yields numerous software engineering benefits, but its quantitative impact on performance remains elusive. One can compare the cost of conservative garbage col...
ISSRE
2002
IEEE
14 years 1 months ago
2002
IEEE
An important aspect of developing models relating the number and type of faults in a software system to a set of structural measurement is defining what constitutes a fault. By de...