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ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
14 years 2 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
ICSOFT
2007
13 years 11 months ago
Macro Impact Analysis Using Macro Slicing
László Vidács, Árp&aac...
PASTE
2005
ACM
14 years 4 months ago
Low overhead program monitoring and profiling
Program instrumentation, inserted either before or during execution, is rapidly becoming a necessary component of many systems. Instrumentation is commonly used to collect informa...
Naveen Kumar, Bruce R. Childers, Mary Lou Soffa