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ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
15 years 8 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
PASTE
2005
ACM
15 years 10 months ago
Low overhead program monitoring and profiling
Program instrumentation, inserted either before or during execution, is rapidly becoming a necessary component of many systems. Instrumentation is commonly used to collect informa...
Naveen Kumar, Bruce R. Childers, Mary Lou Soffa