98 search results - page 9 / 20 » Soft error rate analysis for sequential circuits |
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
ISVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...