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CODES
2006
IEEE
14 years 4 months ago
Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
CBSE
2004
Springer
14 years 3 months ago
CB-SPE Tool: Putting Component-Based Performance Engineering into Practice
A crucial issue in the design of Component-Based (CB) applications is the ability to early guarantee that the system under development will satisfy its Quality of Service requireme...
Antonia Bertolino, Raffaela Mirandola
CLEIEJ
2010
13 years 7 months ago
Practices and Techniques for Engineering Process Capability Models
Software Process Improvement, based on a Maturity Level or a Process Capability Profile, from a Capability Maturity Model or an ISO/IEC 15504-based model, is well established in t...
Clenio F. Salviano, Marcia R. M. Martinez, Alessan...
CODES
2007
IEEE
14 years 4 months ago
Smart driver for power reduction in next generation bistable electrophoretic display technology
Microencapsulated electrophoretic displays (EPDs) are quickly emerging as an important technology for use in battery-powered portable computing devices. Thanks to bistability and ...
Michael A. Baker, Aviral Shrivastava, Karam S. Cha...
AC
2008
Springer
13 years 10 months ago
Computing with RFID- Drivers, Technology and Implications
Radio Frequency Identification or simply rfid has come to be an integral part of modern computing. Rfid is notable in that it is the first practical technology to tightly couple p...
George Roussos