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CAISE
1999
Springer
14 years 2 months ago
Managing Componentware Development - Software Reuse and the V-Modell Process
Dirk Ansorge, Klaus Bergner, Bernhard Deifel, Nich...
ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
13 years 12 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura