Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lomb...
In this paper, we initiate the study of designing approximation algorithms for FaultTolerant Group-Steiner (FTGS) problems. The motivation is to protect the well-studied group-Ste...
- In this paper, we propose an optimal fault tolerant broadcasting algorithm which requires only n+1 steps for an SIMD hypercube with up to n-1 faulty nodes. The basic idea of the ...
Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of ma...
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Z...