87 search results - page 6 / 18 » Space of DRAM fault models and corresponding testing |
VLSID
2005
IEEE
14 years 28 days ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
CISS
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—Fault detection plays an indispensable role in ensuring the security of smart grid systems. Based on the dynamics of the generators, we show the time evolution of the sm...
SRDS
1993
IEEE
13 years 11 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
EVOW
2001
Springer
13 years 12 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
ICSM
2006
IEEE
14 years 1 months ago
2006
IEEE
Although the world-wide-web (WWW) has significantly enhanced open-source software (OSS) development, it has also created new challenges for quality assurance (QA), especially for...