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DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 2 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
CSDA
2006
13 years 7 months ago
2006
The kurtosis coefficient is often regarded as a measure of the tail heaviness of a distribution relative to that of the normal distribution. However, it also measures the peakedne...
BMCBI
2008
13 years 7 months ago
2008
Background: Choosing the appropriate sample size is an important step in the design of a microarray experiment, and recently methods have been proposed that estimate sample sizes ...
ICIP
1998
IEEE
14 years 9 months ago
1998
IEEE
In this paper, we extend the statistical model-based Estimation-Quantization (EQ) wavelet image coding algorithm introduced in [?] to include an adaptive transform component. For ...
KDD
2004
ACM
14 years 8 months ago
2004
ACM
There has historically been very little concern with extrapolation in Machine Learning, yet extrapolation can be critical to diagnose. Predictor functions are almost always learne...