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» Stack Trace Analysis for Large Scale Debugging
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SIGOPS
2010
162views more  SIGOPS 2010»
13 years 7 months ago
Visual and algorithmic tooling for system trace analysis: a case study
Despite advances in the application of automated statistical and machine learning techniques to system log and trace data there will always be a need for human analysis of machine...
Wim De Pauw, Steve Heisig
VLSID
2005
IEEE
224views VLSI» more  VLSID 2005»
14 years 9 months ago
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
DATE
2005
IEEE
158views Hardware» more  DATE 2005»
14 years 2 months ago
Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy
FAST
2009
13 years 6 months ago
Spyglass: Fast, Scalable Metadata Search for Large-Scale Storage Systems
The scale of today's storage systems has made it increasingly difficult to find and manage files. To address this, we have developed Spyglass, a file metadata search system t...
Andrew W. Leung, Minglong Shao, Timothy Bisson, Sh...
INFOCOM
2010
IEEE
13 years 7 months ago
UUSee: Large-Scale Operational On-Demand Streaming with Random Network Coding
—Since the inception of network coding in information theory, we have witnessed a sharp increase of research interest in its applications in communications and networking, where ...
Zimu Liu, Chuan Wu, Baochun Li, Shuqiao Zhao