In this paper, a new method is proposed in order to evaluate the stochastic solution of linear random differential equation. The method is based on the combination of the probabili...
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Two types of variability can occur in model output: variability between replications and variability within each replication. The objective of the model combined with the type of ...
When dealing with sensors with different time resolutions, it is desirable to model a sensor reading as pertaining to a time interval rather than a unit of time. We introduce two ...
Sander Evers, Maarten M. Fokkinga, Peter M. G. Ape...
Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the stat...
Kaviraj Chopra, Bo Zhai, David Blaauw, Dennis Sylv...