651 search results - page 25 / 131 » Statistical Approach to NoC Design |
DAC
2000
ACM
13 years 12 months ago
2000
ACM
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
CAIP
2011
Springer
12 years 7 months ago
2011
Springer
Abstract. In depth map generation, the settings of the algorithm parameters to yield an accurate disparity estimation are usually chosen empirically or based on unplanned experimen...
ICDE
2012
IEEE
11 years 10 months ago
2012
IEEE
—With the exponential growth in the amount of data that is being generated in recent years, there is a pressing need for applying machine learning algorithms to large data sets. ...
CSB
2003
IEEE
14 years 25 days ago
2003
IEEE
The design of large scale DNA microarrays is a challenging problem. So far, probe selection algorithms must trade the ability to cope with large scale problems for a loss of accur...
ASPDAC
2008
ACM
13 years 9 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...