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VLSI
2007
Springer
15 years 9 months ago
Parametric structure-preserving model order reduction
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
Jorge Fernandez Villena, Wil H. A. Schilders, L. M...
221
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Publication
576views
17 years 3 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
150
Voted
ICASSP
2011
IEEE
14 years 7 months ago
Sparse coding and dictionary learning based on the MDL principle
The power of sparse signal coding with learned overcomplete dictionaries has been demonstrated in a variety of applications and fields, from signal processing to statistical infe...
Ignacio Ramírez, Guillermo Sapiro
122
Voted
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
15 years 9 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
129
Voted
CORR
2007
Springer
140views Education» more  CORR 2007»
15 years 3 months ago
From the entropy to the statistical structure of spike trains
— We use statistical estimates of the entropy rate of spike train data in order to make inferences about the underlying structure of the spike train itself. We first examine a n...
Yun Gao, Ioannis Kontoyiannis, Elie Bienenstock