1459 search results - page 137 / 292 » Statistical Modeling for Circuit Simulation |
173
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ISQED
2008
IEEE
16 years 1 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
138
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
158
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FPL
2009
Springer
15 years 11 months ago
2009
Springer
Automated code generation and performance tuning techniques for concurrent architectures such as GPUs, Cell and FPGAs can provide integer factor speedups over multi-core processor...
153
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IUI
2010
ACM
16 years 3 months ago
2010
ACM
We have developed a simulator to help with the design and evaluation of assistive interfaces. The simulator can predict possible interaction patterns when undertaking a task using...
147
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KDD
1994
ACM
15 years 10 months ago
1994
ACM
: Weexemplify in this paper, howa discovery system is applied to the analysis of simulation experimentsin practical political planning, andshowwhatkind of newknowledgecan be discov...