1459 search results - page 41 / 292 » Statistical Modeling for Circuit Simulation |
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
MSWIM
2000
ACM
14 years 2 months ago
2000
ACM
This paper examines the quality of transmission of voice over cellular, packet-switched networks. The medium access mechanism in the uplink is simulated under various statistical m...
MR
2006
13 years 10 months ago
2006
The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review in...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
Small, embedded integrated circuits (ICs) such as smart cards are vulnerable to so-called side-channel attacks (SCAs). The attacker can gain information by monitoring the power co...