Electronic circuit reliability modeling

The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

• Type: Journal
• Year: 2006
• Where: MR
• Authors: Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
• Keywords: Failure Rate, Intrinsic Failure Mechanisms, MR 2006, Reliability Models, Robotics