Electronic circuit reliability modeling

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The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li,

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Failure Rate | Intrinsic Failure Mechanisms | MR 2006 | Reliability Models | Robotics |

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Added	14 Dec 2010
Updated	14 Dec 2010
Type	Journal
Year	2006
Where	MR
Authors	Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor

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Electronic circuit reliability modeling

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