Recent attention on correlated multi-input multi-output systems has centered around the case of imperfect channel or statistical information at the transmitter. The focus of this ...
Vasanthan Raghavan, Ada S. Y. Poon, Venugopal V. V...
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
—We propose an automatic approach to soft color segmentation, which produces soft color segments with an appropriate amount of overlapping and transparency essential to synthesiz...
Statistical relational learning (SRL) algorithms learn statistical models from relational data, such as that stored in a relational database. We previously introduced view learnin...
Jesse Davis, Irene M. Ong, Jan Struyf, Elizabeth S...
A method for Statistical Fault Injection (SFI) into arbitrary latches within a full system hardware-emulated model is validated against particle-beam-accelerated SER testing for a...
Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. ...