We relax the long-held and problematic assumption in shape-from-shading (SFS) that albedo must be uniform or known, and address the problem of “shape and albedo from shading” ...
We propose a unified data modeling approach that is equally applicable to supervised regression and classification applications, as well as to unsupervised probability density func...
Reuse distance (i.e. LRU stack distance) precisely characterizes program locality and has been a basic tool for memory system research since the 1970s. However, the high cost of m...
Xipeng Shen, Jonathan Shaw, Brian Meeker, Chen Din...
Delivering digitally a realistic appearance of materials is one of the most difficult tasks of computer vision. Accurate representation of surface texture can be obtained by means ...
Chip design in the nanometer regime is becoming increasingly difficult due to process variations. ASIC designers have adopted statistical optimization techniques to mitigate the e...