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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
DATE
2009
IEEE
116views Hardware» more  DATE 2009»
14 years 2 months ago
An MDE methodology for the development of high-integrity real-time systems
—This paper reports on experience gained and lessons learned from an intensive investigation of model-driven engineering methodology and technology for application to high-integr...
Silvia Mazzini, Stefano Puri, Tullio Vardanega
ACIVS
2008
Springer
14 years 2 months ago
Scene Reconstruction Using MRF Optimization with Image Content Adaptive Energy Functions
Multi-view scene reconstruction from multiple uncalibrated images can be solved by two stages of processing: first, a sparse reconstruction using Structure From Motion (SFM), and ...
Ping Li, Rene Klein Gunnewiek, Peter H. N. de With
AINA
2007
IEEE
14 years 2 months ago
Synthetic Trace-Driven Simulation of Cache Memory
The widening gap between CPU and memory speed has made caches an integral feature of modern highperformance processors. The high degree of configurability of cache memory can requ...
Rahman Hassan, Antony Harris, Nigel P. Topham, Ari...
ICCV
2001
IEEE
14 years 9 months ago
Learning Inhomogeneous Gibbs Model of Faces by Minimax Entropy
In this paper we propose a novel inhomogeneous Gibbs model by the minimax entropy principle, and apply it to face modeling. The maximum entropy principle generalizes the statistic...
Ce Liu, Song Chun Zhu, Heung-Yeung Shum