— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
—This paper reports on experience gained and lessons learned from an intensive investigation of model-driven engineering methodology and technology for application to high-integr...
Multi-view scene reconstruction from multiple uncalibrated images can be solved by two stages of processing: first, a sparse reconstruction using Structure From Motion (SFM), and ...
Ping Li, Rene Klein Gunnewiek, Peter H. N. de With
The widening gap between CPU and memory speed has made caches an integral feature of modern highperformance processors. The high degree of configurability of cache memory can requ...
Rahman Hassan, Antony Harris, Nigel P. Topham, Ari...
In this paper we propose a novel inhomogeneous Gibbs model by the minimax entropy principle, and apply it to face modeling. The maximum entropy principle generalizes the statistic...