44 search results - page 4 / 9 » Statistical approach in a system level methodology to deal w... |
ISTA
2007
13 years 10 months ago
2007
: Today, discrete-event simulation (DES) use in the manufacturing industry has become widespread, but far from all companies use this technology.Often simulation is used on a `one-...
DAC
2012
ACM
11 years 11 months ago
2012
ACM
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
RECOMB
2002
Springer
14 years 9 months ago
2002
Springer
We present a new statistically optimal approach to estimate transcript levels and ratios from one or more gene array experiments. The Bayesian Estimation of Array Measurements (BE...