Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
This paper presents a data-centric modeling and predictive control approach for nonlinear hybrid systems. System identification of hybrid systems represents a challenging problem b...
Abstract. We present a novel approach to statistically characterize histograms of model-relative image regions. A multiscale model is used as an aperture to define image regions a...
Robert E. Broadhurst, Joshua Stough, Stephen M. Pi...
We present a novel histogram method for statistically characterizing the appearance of deformable models. In deformable model segmentation, appearance models measure the likelihoo...
Robert E. Broadhurst, Joshua Stough, Stephen M. Pi...
Reuse distance (i.e. LRU stack distance) precisely characterizes program locality and has been a basic tool for memory system research since the 1970s. However, the high cost of m...
Xipeng Shen, Jonathan Shaw, Brian Meeker, Chen Din...