182 search results - page 6 / 37 » Statistical behavioral modeling and characterization of A D ... |
ISPASS
2007
IEEE
14 years 2 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
CDC
2010
IEEE
13 years 3 months ago
2010
IEEE
This paper presents a data-centric modeling and predictive control approach for nonlinear hybrid systems. System identification of hybrid systems represents a challenging problem b...
DSSCV
2005
Springer
14 years 2 months ago
2005
Springer
Abstract. We present a novel approach to statistically characterize histograms of model-relative image regions. A multiscale model is used as an aperture to define image regions a...
ISBI
2006
IEEE
14 years 9 months ago
2006
IEEE
We present a novel histogram method for statistically characterizing the appearance of deformable models. In deformable model segmentation, appearance models measure the likelihoo...
POPL
2007
ACM
14 years 8 months ago
2007
ACM
Reuse distance (i.e. LRU stack distance) precisely characterizes program locality and has been a basic tool for memory system research since the 1970s. However, the high cost of m...