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CVPR
2009
IEEE
15 years 3 months ago
A Projective Framework for Radiometric Image Analysis
Different materials reflect light in different ways, and reflectance interacts with shape, lighting, and viewpoint to determine an object’s image. Common materials exhibit dive...
Ping Tan (National University of Singapore), Todd ...
CVPR
2006
IEEE
14 years 10 months ago
Clustering Appearance for Scene Analysis
We propose a new approach called "appearance clustering" for scene analysis. The key idea in this approach is that the scene points can be clustered according to their s...
Sanjeev J. Koppal, Srinivasa G. Narasimhan
ECCV
2008
Springer
14 years 10 months ago
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
Fabiano Romeiro, Yuriy Vasilyev, Todd Zickler
ICCV
2007
IEEE
14 years 2 months ago
Reconstructing the Surface of Inhomogeneous Transparent Scenes by Scatter-Trace Photography
We present a new method for reconstructing the exterior surface of a complex transparent scene with inhomogeneous interior (e.g., multiple interfaces, reflective or painted inter...
Nigel J. W. Morris, Kiriakos N. Kutulakos
SIGGRAPH
1998
ACM
14 years 24 days ago
Rendering Synthetic Objects into Real Scenes: Bridging Traditional and Image-based Graphics with Global Illumination and High Dy
We present a method that uses measured scene radiance and global illumination in order to add new objects to light-based models with correct lighting. The method uses a high dynam...
Paul E. Debevec