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ATS
2005
IEEE
191views Hardware» more  ATS 2005»
14 years 4 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
VTS
1997
IEEE
86views Hardware» more  VTS 1997»
14 years 2 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
ICCAD
1995
IEEE
163views Hardware» more  ICCAD 1995»
14 years 1 months ago
Signal integrity optimization on the pad assignment for high-speed VLSI design
Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simulta...
Kai-Yuan Chao, D. F. Wong
CHI
2008
ACM
14 years 12 days ago
Comparing access methods and quality of 3g mobile video streaming services
In this paper we examine the access methods and the quality of experience of current unicast video streaming services in 3G mobile networks. A packet-switched mobile video client,...
Marcin Davies, Antitza Dantcheva, Peter Fröhl...
INFOCOM
2002
IEEE
14 years 3 months ago
On Multiple Description Streaming with Content Delivery Networks
Abstract— CDNs have been widely used to provide low latency, scalability, fault tolerance, and load balancing for the delivery of web content and more recently streaming media. W...
John G. Apostolopoulos, Tina Wong, Susie J. Wee, D...