Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simulta...
In this paper we examine the access methods and the quality of experience of current unicast video streaming services in 3G mobile networks. A packet-switched mobile video client,...
Abstract— CDNs have been widely used to provide low latency, scalability, fault tolerance, and load balancing for the delivery of web content and more recently streaming media. W...
John G. Apostolopoulos, Tina Wong, Susie J. Wee, D...