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125
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TPHOL
2005
IEEE
15 years 8 months ago
A Structured Set of Higher-Order Problems
Abstract. We present a set of problems that may support the development of calculi and theorem provers for classical higher-order logic. We propose to employ these test problems as...
Christoph Benzmüller, Chad E. Brown
100
Voted
EDOC
2007
IEEE
15 years 9 months ago
DECLARE: Full Support for Loosely-Structured Processes
—Traditional Workflow Management Systems (WFMSs) are not flexible enough to support loosely-structured processes. Furthermore, flexibility in contemporary WFMSs usually comes ...
Maja Pesic, Helen Schonenberg, Wil M. P. van der A...
130
Voted
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
15 years 2 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
92
Voted
ICSM
2007
IEEE
15 years 9 months ago
Re-computing Coverage Information to Assist Regression Testing
This paper presents a technique that leverages an existing regression test-selection algorithm to compute accurate, updated coverage data on a version of the software, Pi+1, witho...
Pavan Kumar Chittimalli, Mary Jean Harrold
SIGSOFT
2007
ACM
16 years 3 months ago
Program representations for testing wireless sensor network applications
Because of the growing complexity of wireless sensor network applications (WSNs), traditional software development tools are being developed that are specifically designed for the...
Nguyet T. M. Nguyen, Mary Lou Soffa