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MICAI
2004
Springer
14 years 1 months ago
Faster Proximity Searching in Metric Data
A number of problems in computer science can be solved efficiently with the so called memory based or kernel methods. Among this problems (relevant to the AI community) are multime...
Edgar Chávez, Karina Figueroa
DATE
2010
IEEE
123views Hardware» more  DATE 2010»
14 years 23 days ago
Interconnect delay and slew metrics using the beta distribution
—Integrated circuit process technology is entering the ultra deep submicron era. At this level, interconnect structure becomes very stiff and the metal resistance shielding effec...
Jun-Kuei Zeng, Chung-Ping Chen
ECOOPW
1999
Springer
13 years 12 months ago
The GOODLY Design Language for MOOD2 Metrics Collection
The GOODLY language can be used to specify the design of systems built according to the Object Oriented paradigm. It was conceived with the main purpose of facilitating the extrac...
Fernando Brito e Abreu, Luis Ochoa, Miguel Goul&at...
ER
2007
Springer
125views Database» more  ER 2007»
14 years 1 months ago
On the Correlation between Process Model Metrics and Errors
Business process models play an important role for the management, design, and improvement of process organizations and process-aware information systems. Despite the extensive ap...
Jan Mendling, Gustaf Neumann, Wil M. P. van der Aa...
MVA
2007
165views Computer Vision» more  MVA 2007»
13 years 9 months ago
Self-Calibration for Metric 3D Reconstruction Using Homography
In this paper, our goal is to reconstruct metric 3D models for large structures (or other 3D objects) from uncalibrated images. The internal camera parameters are estimated by usi...
Cheng-Yuan Tang, Yi-Leh Wu, Pei-Ching Hu, Hsien-Ch...