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» Summarizing itemset patterns using probabilistic models
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SRDS
1993
IEEE
13 years 11 months ago
Bayesian Analysis for Fault Location in Homogeneous Distributed Systems
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
Yu Lo Cyrus Chang, Leslie C. Lander, Horng-Shing L...
RAS
2000
161views more  RAS 2000»
13 years 7 months ago
Active object recognition by view integration and reinforcement learning
A mobile agent with the task to classify its sensor pattern has to cope with ambiguous information. Active recognition of three-dimensional objects involves the observer in a sear...
Lucas Paletta, Axel Pinz
CVPR
2009
IEEE
15 years 2 months ago
Observe Locally, Infer Globally: a Space-Time MRF for Detecting Abnormal Activities with Incremental Updates
We propose a space-time Markov Random Field (MRF) model to detect abnormal activities in video. The nodes in the MRF graph correspond to a grid of local regions in the video fra...
Jaechul Kim (University of Texas at Austin), Krist...
CVPR
2007
IEEE
14 years 9 months ago
An MRF and Gaussian Curvature Based Shape Representation for Shape Matching
Matching and registration of shapes is a key issue in Computer Vision, Pattern Recognition, and Medical Image Analysis. This paper presents a shape representation framework based ...
Pengdong Xiao, Nick Barnes, Tibério S. Caet...
BMCBI
2004
126views more  BMCBI 2004»
13 years 7 months ago
Visualization and analysis of microarray and gene ontology data with treemaps
Background: The increasing complexity of genomic data presents several challenges for biologists. Limited computer monitor views of data complexity and the dynamic nature of data ...
Eric H. Baehrecke, Niem Dang, Ketan Babaria, Ben S...