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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 4 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
SOQUA
2007
13 years 11 months ago
ConTest listeners: a concurrency-oriented infrastructure for Java test and heal tools
With the proliferation of the new multi-core personal computers, and the explosion of the usage of highly concurrent machine configuration, concurrent code moves from being writt...
Yarden Nir-Buchbinder, Shmuel Ur
ICFP
2000
ACM
14 years 2 months ago
Functional programming in C++
This paper describes FC++: a rich library supporting functional programming in C++. Prior approaches to encoding higher order functions in C++ have suffered with respect to polymo...
Brian McNamara, Yannis Smaragdakis
OOPSLA
2007
Springer
14 years 4 months ago
CUTE: C++ unit testing easier
This article describes the design and use of the CUTE C++ testing framework and its integration into the Eclipse C++ Development Tooling. Unit testing supports code quality and is...
Peter Sommerlad, Emanuel Graf
ECLIPSE
2005
ACM
13 years 12 months ago
IDE Support for test-driven development and automated grading in both Java and C++
Students need to learn testing skills, and using test-driven development on assignments is one way to help students learn. We use a flexible automated grading system called Web-CA...
Anthony Allowatt, Stephen Edwards