327 search results - page 35 / 66 » Symbolic Fault Injection |
DFT
2002
IEEE
14 years 18 days ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
ATS
2002
IEEE
14 years 19 days ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
CODES
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper presents a system synthesis approach for dependable embedded systems. The proposed approach significantly extends previous work by automatically inserting fault detect...
SCAM
2008
IEEE
14 years 2 months ago
2008
IEEE
Traditional mutation testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easil...
DSN
2007
IEEE
14 years 2 months ago
2007
IEEE
Autonomous robots offer alluring perspectives in numerous application domains: space rovers, satellites, medical assistants, tour guides, etc. However, a severe lack of trust in t...