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TASE
2009
IEEE
14 years 2 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...
DATE
2005
IEEE
117views Hardware» more  DATE 2005»
14 years 1 months ago
Implicit and Exact Path Delay Fault Grading in Sequential Circuits
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...
Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, S...
PROMISE
2010
13 years 2 months ago
Exploiting count spectra for Bayesian fault localization
Background: Automated diagnosis of software defects can drastically increase debugging efficiency, improving reliability and time-to-market. Current, low-cost, automatic fault dia...
Rui Abreu, Alberto González-Sanchez, Arjan ...
DFT
2008
IEEE
149views VLSI» more  DFT 2008»
13 years 9 months ago
Can Knowledge Regarding the Presence of Countermeasures Against Fault Attacks Simplify Power Attacks on Cryptographic Devices?
Side-channel attacks are nowadays a serious concern when implementing cryptographic algorithms. Powerful ways for gaining information about the secret key as well as various count...
Francesco Regazzoni, Thomas Eisenbarth, Luca Breve...
CORR
2010
Springer
104views Education» more  CORR 2010»
13 years 7 months ago
Heuristic approach to optimize the number of test cases for simple circuits
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
S. M. Thamarai, K. Kuppusamy, T. Meyyappan