171 search results - page 18 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
HIS
2001
13 years 10 months ago
2001
Abstract. Linear Discriminant (LD) techniques are typically used in pattern recognition tasks when there are many (n >> 104 ) datapoints in low-dimensional (d < 102 ) spac...
DSD
2006
IEEE
14 years 3 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
IBPRIA
2007
Springer
14 years 3 months ago
2007
Springer
Abstract. Piecewise-linear methods accomplish the registration by dividing the images in corresponding triangular patches, which are individually mapped through affine transformati...
DAC
2005
ACM
13 years 11 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
ICES
2000
Springer
14 years 21 days ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...