151 search results - page 12 / 31 » Systematic test program generation for SoC testing using emb... |
RSP
2005
IEEE
14 years 1 months ago
2005
IEEE
Nowadays, Architecture Description Languages (ADLs) are getting popular to speed up the development of complex SoC design, by performing the design space explon a higher level of ...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
EDCC
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
VTS
1997
IEEE
14 years 3 days ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ASPLOS
2012
ACM
12 years 3 months ago
2012
ACM
Processor emulators are widely used to provide isolation and instrumentation of binary software. However they have proved difficult to implement correctly: processor specificati...