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ETS
2011
IEEE
230views Hardware» more  ETS 2011»
12 years 9 months ago
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
ATC
2007
Springer
14 years 3 months ago
A Distributed Self-healing Data Store
Due to the huge amount of integrated devices and sensors in everyday objects ubiquitous systems are in vicinity and will be deployed in large scales in the near future. We expect t...
Wolfgang Trumler, Jörg Ehrig, Andreas Pietzow...
SIGSOFT
2007
ACM
14 years 10 months ago
Towards incremental adaptive covering arrays
The increasing complexity of configurable software systems creates a need for more intelligent sampling mechanisms to detect and locate failure-inducing dependencies between confi...
Adam A. Porter, Myra B. Cohen, Sandro Fouché...
DEXAW
2007
IEEE
120views Database» more  DEXAW 2007»
14 years 3 months ago
Understanding enterprise integration project risks: A focus group study
The prerequisites of success and reasons for failure for enterprise integration projects are still not wellunderstood as evidenced by large failure rates, including cost or schedu...
Sandeep Purao, Sharoda Paul, Steven Smith
INFOCOM
2007
IEEE
14 years 3 months ago
Revenue Focused Protection for VOD in DWDM Rings
—New protection schemes for video on demand (VOD) in a DWDM ring network are proposed that employ information per customer. Unlike prior schemes that rely on fixed priorities, th...
Ornan Ori Gerstel, Galen H. Sasaki, Ashok Balasubr...