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TCAD
2008
118views more  TCAD 2008»
13 years 8 months ago
Variability-Aware Bulk-MOS Device Design
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
Javid Jaffari, Mohab Anis
TIP
2008
154views more  TIP 2008»
13 years 8 months ago
Adaptive Local Linear Regression With Application to Printer Color Management
Abstract--Local learning methods, such as local linear regression and nearest neighbor classifiers, base estimates on nearby training samples, neighbors. Usually, the number of nei...
Maya R. Gupta, Eric K. Garcia, E. Chin
TPDS
2008
89views more  TPDS 2008»
13 years 8 months ago
Power/Performance/Thermal Design-Space Exploration for Multicore Architectures
Multicore architectures have been ruling the recent microprocessor design trend. This is due to different reasons: better performance, thread-level parallelism bounds in modern app...
Matteo Monchiero, Ramon Canal, Antonio Gonzá...
TOCL
2002
110views more  TOCL 2002»
13 years 8 months ago
Abstract computability and algebraic specification
Computability and Algebraic Specification J. V. TUCKER University of Wales, Swansea and J. I. ZUCKER McMaster University Abstract computable functions are defined by abstract finit...
J. V. Tucker, Jeffery I. Zucker
ET
2010
89views more  ET 2010»
13 years 7 months ago
On the Duality of Probing and Fault Attacks
In this work we investigate the problem of simultaneous privacy and integrity protection in cryptographic circuits. We consider a white-box scenario with a powerful, yet limited at...
Berndt M. Gammel, Stefan Mangard