176 search results - page 8 / 36 » Techniques for Functional Test Pattern Execution |
ICST
2009
IEEE
14 years 3 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
ITC
1995
IEEE
14 years 9 days ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ICFP
2007
ACM
14 years 19 days ago
2007
ACM
In this paper we introduce the iTask system: a set of combinators to specify work flows in a pure functional language at a very high level of abstraction. Work flow systems are au...
ENTCS
2007
13 years 8 months ago
2007
Computing with failures is a typical programming technique in functional logic programs. However, there are also situations where a program should not fail (e.g., in a determinist...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...