It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
In this paper we introduce the iTask system: a set of combinators to specify work flows in a pure functional language at a very high level of abstraction. Work flow systems are au...
Rinus Plasmeijer, Peter Achten, Pieter W. M. Koopm...
Computing with failures is a typical programming technique in functional logic programs. However, there are also situations where a program should not fail (e.g., in a determinist...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...