Class syntax can be used to 1) model temporal or locational evolvement of class labels of feature observation sequences, 2) correct classification errors of static classifiers if ...
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
This paper considers the optimization of transceivers with decision feedback equalizers (DFE) for slowly time-varying memoryless multi-input multi-output (MIMO) channels. The data ...
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...
Advanced Business Process Management (BPM) tools enable the decomposition of previously integrated and often ill-defined processes into reusable process modules. These process modu...