46 search results - page 4 / 10 » Test Coverage for Continuous and Hybrid Systems |
ICCAD
2010
IEEE
13 years 5 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
ATAL
2010
Springer
13 years 8 months ago
2010
Springer
An ever-growing infrastructure, including existing and newly built power plants, as well as a rising environmental awareness in society call for inspection and maintenance systems...
MAM
2008
13 years 7 months ago
2008
This paper presents a design methodology for a hybrid Hardwarein-the-Loop (HIL) tester tool, based on both discrete event system theory, given by timed automata, and continuous sy...
ISCAS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new ho...
GI
2009
Springer
13 years 5 months ago
2009
Springer
Abstract: Model based testing promises systematic test coverage in a continuous testing process. However, in practice, model based testing struggles with informal specifications, d...