20 search results - page 2 / 4 » Test Data Compression Using Dictionaries with Fixed-Length I... |
ET
2002
13 years 7 months ago
2002
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
ICCD
1999
IEEE
13 years 12 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
DFT
2005
IEEE
13 years 9 months ago
2005
IEEE
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
CIKM
2009
Springer
14 years 5 days ago
2009
Springer
Exact substring matching queries on large data collections can be answered using q-gram indices, that store for each occurring q-byte pattern an (ordered) posting list with the po...